Resonator techniques for reflectivity and surface resistivity at high temperature: Methodology and measurements

Two different methodologies based on resonator techniques are presented. The first has been realized for wide band reflectivity characterization at high temperature while the second has been developed to verify surface resistivity including roughness, surface contamination and other undesired effect. Both methods have been developed for characterization over a large temperature range. Measurement results on Ti6Al4V samples, Copper and AlBeMet ® are presented.