RAMAN SCATTERING FROM InAs NANOCRYSTALS EMBEDDED IN SiO 2 THIN FILMS

Raman scattering from InAs nanocrystals embedded in SiO 2 thin films has been measured and studied. Raman spectra of InAs nanocrystals have a similar feature with that of bulk InAs crystal. Broadened and red-shifted Raman scattering peaks were observed from the nanocrystals; this has been attributed to the phonon confinement effect. A compressive stress in the interface between InAs nanocrystals and the SiO 2 matrix was also taken into account to interpret the red shift.