Shot noise in NbN SIS junctions suitable for THz radiation detection

We study the behavior of NbN SIS junctions as radiation detectors with emphasis on the shot noise generated at voltages below the gap voltage. The intrinsically large subgap current of NbN junctions is carried by pinholes with a conduction attributed to multiple Andreev reflection, leading to transported charges q much greater than e. Using this charge enhancement mechanism we explain the junction shot noise characteristics in the unpumped case as well as in the pumped case. The measured mixer noise temperature in the pumped case is more than twice that calculated with standard Tucker theory. The measured double side band noise temperatures are 1450 K at 600 GHz and 2800 K at 950 GHz.