Study of spin-coated resist coverage on nanoscale topography using spectroscopic ellipsometry

Using spectroscopic ellipsometry and rigorous coupled wave analysis, we studied the spin-coated resist coverage on 72.6 nm pitch line-and-space patterns of various depths (from ∼20 to ∼130 nm). Within the margin of measurement error, we find the tested nano-patterns have no apparent effect on the spin-coated resist thickness. The result suggests that, during the spinning, the resist ceased to flow at a critical thickness much larger than the pattern depth, and the resist thinning afterwards was dominated by solvent evaporation. The methods and results demonstrated in this work can improve the characterization and process control in a number of applications where spin coating on high-density nano-scale topographies is required.