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Defect Characterization after Si and C Implantation in 4H-SiC.
Defect Characterization after Si and C Implantation in 4H-SiC.
2011
Venkata C. Kummari
Mangal Dhoubhadel
Bibhudutta Rout
Floyd Del McDaniel
Weilin Jiang
Tilo Reinert
Keywords:
Optoelectronics
Materials science
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