Multilayer Antireflection Coating for perceptible band on Silicon Substrate

Present work aims at the characterization of ARC films in the visible spectrum, up to five layers antireflection coating film were designed and simulated, optical reflection values were deduced with a Transfer Matrix Method formulation (TMM). Six materials including nanoporous material have been selected to investigate the optimum values of the Anti reflection coating (ARC) film for solar cells. The present work has been carried out to investigate the optimum values of reflectance as a function of wavelength in the visible region. The reflectance has been reduced from 32% of silicon surface to less than 1% using multilayer ARC film. It has been observed that by increasing the number of layers the average reflectance decreases over a broad range of visible spectrum.