Depth profile analysis of electrodeposited nanoscale multilayers by SNMS

Abstract As early as 10 years after the discovery of the giant magnetoresistance (GMR) the magnetic/non-magnetic multilayers found their first application in the read-out units of magnetic recording media, and the hard disk drives with GMR-based sensors since gained a dominating market share. In spite of the large number of works published on nanoscale multilayers, data on the depth profile of electrodeposited multilayer samples are very scarce. This work deals with the depth profile analysis of electrodeposited CoNiCu/Cu and Co/Cu multilayers films. Commercial Cu sheet and a Cr/Cu layer evaporated onto Si (1 1 1) surface were used as substrates with high and low roughness, respectively. The Secondary Neutral Mass Spectrometry (SNMS) depth profile analysis clearly revealed the layered structure of the samples. The resolution of the individual layers varied with the initial roughness of the substrate. The SNMS spectra showed that the oxygen incorporation into the layers is insignificant. When both Ni and Co are present in the magnetic layer, the composition of the samples is influenced by both the anomalous codeposition properties of the iron-group elements and the mass transport of the corresponding ions in the electrolyte. This observation draws the attention to the possible inhomogeneity of the magnetic layers in electrodeposited samples.