Deflection of 450 GeV protons by planar channeling in a bent silicon crystal

Abstract A 450 GeV proton beam has been bent by various angles from 4 to 14 mrad using planar channeling in a (111) silicon crystal. Detailed investigations of the deflected beam as well as the unbent and scattered particles have been performed. The incident beam had a divergence of about 35 μrad (FWHM). 20% of the protons hitting the crystal front face were found to be initially channeled. The measured bending efficiencies range from 5 to 2% (for increasing deflection angles) are compared to theoretical estimates including surface acceptance and dechanneling in bent silicon crystals.