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Positive Bias Temperature Instability of SiC-MOSFETs Induced by Switching Operation (AC-PBTI)
Positive Bias Temperature Instability of SiC-MOSFETs Induced by Switching Operation (AC-PBTI)
2016
Eiichi Murakami
Takahiro Furuichi
T. Takeshita
Kazuhiro Oda
Keywords:
Materials science
Condensed matter physics
Temperature instability
positive bias temperature instability
Correction
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