Principle and Application of Peak Force Tapping Mode Atomic Force Microscope

Unlike conventional optical and electron microscopies, atomic force microscopy (AFM) characterizes the properties of samples at high resolution by controlling and detecting the interaction between the tip and the sample. The basic working principle of AFM is briefly described. Quantitative nano-scale morphology, mechanical properties and corresponding test methods of mechanical parameters of AFM with peak force tapping mode (PFTM) are described. Finally, the practical applications of peak force tapping mode atomic force microscopy (PAM) in analysis and measurement are reviewed, showing the advantages and broad application prospects of its PFTM.