Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System

A new method for measuring material homogeneity using fast scanning technique was proposed and demonstrated with the line-focus-beam ultrasonic-material-characterization (LFB-UMC) system. Similar velocity profiles of leaky surface acoustic wave (LSAW) for a Ca 3 Ta(Ga 0.75 Al 0.25 ) 3 Si 2 O 14 [CTGAS] single crystal specimen were successfully obtained by both of the new V(x) and the conventional V(z) methods. We have verified the new V(x) method was 56 times faster than the conventional V(z) method. Although the V(z) method is superior to the V(x) method in a viewpoint of measurement accuracy, the V(x) method has great advantage enabling us to quickly evaluate material homogeneity over the wide area of specimen.