A double focusing crystal spectrometer for low energy X-rays

W. Beer,M. Bogdan,J. F. Gilot,P.F.A. Goudsmit,H.J. Leisi,A. J. Rusi El Hassani,D. Sigg,St. Thomann,W. Volken,D. Bovet,E. Bovet,D. Chatellard,J.-P. Egger,G. Fiorucci,K. Gabathuler,L. M. Simons

A double focusing crystal spectrometer for low energy X-rays

1992

W. Beer
M. Bogdan
J. F. Gilot
P.F.A. Goudsmit
H.J. Leisi
A. J. Rusi El Hassani
D. Sigg
St. Thomann
W. Volken
D. Bovet
E. Bovet
D. Chatellard
J.-P. Egger
G. Fiorucci
K. Gabathuler
L. M. Simons

Abstract A high resolution double focusing crystal spectrometer is described. Thirteen single silicon crystals are used to reflect the X-ray beam onto three CCD detectors. An energy resolution of 4 eV FWHM was reached in a measurement of the 2.9 keV K α1 and K α2 lines in argon.

Keywords:

Detector
Beam (structure)
Nuclear magnetic resonance
Optics
Physics
Spectrometer
Argon
Crystal
Silicon
Full width at half maximum
crystal spectrometer
low energy

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