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Structural Defect Effect on Electrical Property of p-type Layered Semiconductor (LaO)CuS
Structural Defect Effect on Electrical Property of p-type Layered Semiconductor (LaO)CuS
2003
S. Kanno
Kouichi Takase
Tomohiro Shimizu
O. Shoji
K. Sato
T. Echizenya
Yumiko Takahashi
Y Takano
Kazuko Sekizawa
Keywords:
Nanotechnology
Semiconductor
Materials science
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