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Single event effects characterization of 16K x 9 fifo
Single event effects characterization of 16K x 9 fifo
2003
R. Marec
P. Ribeiro
L. Cresciucci
C. Barillot
C. Chatty
P. Calvel
Keywords:
Physics
Read-write memory
Single event upset
Space technology
FIFO (computing and electronics)
CMOS
Electronic engineering
cmos process
chemical technology
Correction
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