Accelerated lifetime testing of p + n − n + photodiode

To estimate the lifetime of silicon photodetectors, an accelerated lifetime test was implemented. Using plots of inspected interval data based on the maximum likelihood technique (implementing the software package CENSOR), it was found that the Weibull distribution fits the lifetime test data. Calculating the cumulative distribution function and the acceleration factor, the median lifetime of the silicon detector at room temperature was 8.936 × 106 hours and the confidence interval with 95% probability was (7.155−10.575) × 106 hours.