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Endurance Characterization of Ferroelectric Cell in 64Mb FRAM Device By Analyzing the Space Charge Concentration
Endurance Characterization of Ferroelectric Cell in 64Mb FRAM Device By Analyzing the Space Charge Concentration
2007
E.-S. Lee
Y. M. Kang
Dong-Jin Jung
Hyuk Kim
Y. K. Hong
J. H. Park
Sung-Wook Kang
Jung-hyeon Kim
Hyun-Taek Kim
W. W. Jung
W S Ahn
J. Y. Jung
J. Y. Kang
D. Y. Choi
H. K. Goh
S. Y. Kim
Suyoun Lee
H.S. Jeong
Keywords:
Nuclear magnetic resonance
Ferroelectricity
Materials science
Space charge
Optoelectronics
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