Combined analysis of static and dynamic magnetic characteristics of multilayer CoFeZr/α-Si nanostructures

The combined method of static and dynamic magnetic measurements is used to study nano-dimensional multilayer amorphous CoFeZr/α -Si films. It is established that at the thickness of magnetic layers x = 5–12 nm their magnetization does not differ from that of the bulk material. It is shown that as x is lowered to 2–3 nm, the magnetization of magnetic layers decreases, which may be due to the formation of mixed layers containing nonmagnetic silicides. At a thickness of nonmagnetic interlayers of less than 1 nm the features characteristic of a weak antiferromagnetic interaction of neighboring layers are observed.