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Reflectance measurements of PTFE, Kapton, and PEEK for xenon scintillation light for the LZ detector.
Reflectance measurements of PTFE, Kapton, and PEEK for xenon scintillation light for the LZ detector.
2017
M. Arthurs
E. Batista
J. Haefner
W. Lorenzon
D. Morton
A. Neff
M. Okunawo
Kirill Pushkin
A. Sander
Scott Stephenson
Y. Wang
Keywords:
Detector
Xenon
Kapton
Reflectivity
Peek
Scintillation
Materials science
Optics
Correction
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