Device for determination of charged particle beam profile and position

Abstract Design features and characteristics of a device for determining the charged particle beam profile and position are discussed. The device is based on scanning the beam with a thin metal probe. Profile distortions, which result from the fact that the probe traverses the beam in a circular arc while the oscilloscope scanning is linear, are estimated. It is shown that, with the monitor having r / R = 0.5 ( r is the beam radius and R is the probe rotation radius), distortions are less than 2.5%.