Performance and reliability investigations of waveguide-integrated photodetectors

The reliability of 50 GHz waveguide-integrated photodetectors is studied under accelerated aging in standard high temperature tests and in additional reliability tests applying high optical input power onto the photodetectors. Based on the experimental data we determined lifetimes exceeding the requirements of telecom operators. No measureable performance degradation was found after 2000 hours high-temperature high-power stress conditions.