Spectrum-feature extraction from diffuse reflectance using multiplicative-factor decomposition

This study describes a methodogy for spectrum-feature extraction from diffuse reflectance for distributions of materials on substrates, which is based on diffuse-reflectance theory and phenomenological multiplicative-factor decomposition of reflectance functions. Specifically, this methodology entails feature-extraction using reflectance-spectrum normalization with respect to phenomenological backgrounds. A mathematical analysis of the feature-extraction methodology with respect to its formulation is presented. In addition, results of inverse analyses demonstrating application of the methodology are described.