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Advances in X-Ray Imaging Crystal Spectrometer Design Through Raytracing
Advances in X-Ray Imaging Crystal Spectrometer Design Through Raytracing
2020
N. A. Pablant
M. Bitter
L. F. Delgado Aparicio
K. W. Hill
Lan Gao
Brian Kraus
Andreas Langenberg
Z. Cheng
M. de Bock
J. Kring
M. Slominski
Y. Yakusevitch
Keywords:
Optics
X-ray
crystal spectrometer
Ray tracing (graphics)
Materials science
Correction
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