Effect of local electric fields on microchannel plate detection of incident 20 keV protons

We present data demonstrating the influence of an applied electric field E oriented normal to the input surface of a microchannel plate (MCP) detector on the critical operating parameters of the detector, including the quantum detection efficiency, the spatial resolution, and pulse height distribution. The MCP detector response is characterized using 20 keV protons as the primary radiation. An applied electric field E<−4 V/mm, where a negative value of E corresponds to a nearby object that is biased positive relative to the input surface, results in a high spatial resolution and a quantum detection efficiency that is approximately equal to the open area ratio of the MCP. An electric field −1

Keywords:

• Detector
• Secondary emission
• Radiation
• Quantum efficiency
• Optics
• Proton
• Nuclear magnetic resonance
• Microchannel plate detector
• Electric field
• Physics
• Detective quantum efficiency
• Image resolution
• Ion
• Atomic physics

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