Emissivity-corrected power loss calibration for lock-in thermography measurements on silicon solar cells

This paper describes power loss calibration procedures with implemented emissivity correction. The determination of our emissivity correction matrix does neither rely on blackbody reference measurements nor on the knowledge of any sample temperatures. To describe the emissivity-corrected power calibration procedures in detail, we review the theory behind lock-in thermography and show experimentally that the lock-in signal is proportional to the power dissipation in the solar cell. Experiments show the successful application of our emissivity correction procedure, which significantly improves the informative value of lock-in thermography images and the reliability of the conclusions drawn from these images.