Architecture and Selected Algorithms of a Process Condition Monitoring Microsystem

Abstract A new microsystem is presented which is able to process measurements including feature extraction and classification for local process monitoring. The heart of the microsystem is a 16-bit digital signal processor which can operate at up to 100 MIPS (million instructions per second). The extracted features are stored in a large non-volatile memory and are used for a long term trend analysis. Current and predicted faults are displayed locally and announced to the staff or a host computer via field bus or internet. The microsystem has been applied to an autonomous bearing fault diagnosis.