Correction to "Investigation of charge loss mechanism of thickness-scalable trapping layer by variable temperature Kelvin probe force microscopy" [Jul 13 870-872]

In the above-named article [ibid., vol. 34, no. 7, pp. 870-872, Jul. 2013], the corresponding author is not correctly indicated. Z. Huo and M. Liu should be the authors to whom correspondence for the published letter should be directed toward.