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Coherent X-ray Reflectivity Measurements From Oxidized Si (111) Surfaces
Coherent X-ray Reflectivity Measurements From Oxidized Si (111) Surfaces
1996
J. L. Libbert
I. K. Robinson
Ronald Pindak
R. M. Fleming
S. B. Dierker
Keywords:
X-ray reflectivity
Analytical chemistry
Materials science
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