Photoluminescence in laser ablated nanostructured indium oxide thin films

Nanocrystalline indium oxide films have been deposited using pulsed laser ablation technique at different substrate temperatures and the films are post annealed at different temperatures. The structural, optical and electrical properties of the films are investigated by XRD, SEM, AFM, UV-Visible spectra, photoluminescence spectra and electrical conductivity measurements. X-ray diffractograms of the as-deposited and post-annealed films A to C show that films are amorphous at lower substrate temperatures and transform to mixture of amorphous and crystalline phases. The grain size determination based on Debye Scherrer’s formula shows that the average grain size of the crystallites in the films…