language-icon Old Web
English
Sign In
Acemap > Paper > Elaboration of near‐valence band defect states leading deterioration of ambipolar operation in SnO thin‐film transistors

Elaboration of near‐valence band defect states leading deterioration of ambipolar operation in SnO thin‐film transistors

2021 
Keywords:
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    51
    References
    0
    Citations
    NaN
    KQI
    []
    logo
    • CCF Conference Analysis
    • Map Galaxy
    • What's New
    © Copyright 2015-2020 Acemap, Inc. Shanghai Jiao Tong University.