Increased Reliability for J0-analysis by QSSPC☆

Abstract This work investigates the influence of physical parameters and of different methods on the analysis of QSSPC measurements with the aim to extract J 0 -values of diffused surfaces. We show that the right choice of not only the parameter-set and physical models but also the method is crucial. The comparison with injection dependent simulation data leads to a deviation of up to 34 % from the absolute J 0 -value for parameters found in literature. In contrast, the recently implemented method in the WCT-120 lifetime tester software [1] which accounts for band-gap narrowing in the substrate agrees within 3 % over the full range of assumed base doping. Furthermore we show that the carrier-lifetime in the substrate shows a significant influence on J 0 -values obtained using the absolute measured recombination and leads to overestimation of up to 50 % even for high base-lifetimes of τ SRH  = 1 ms. The implemented parameter-set and analysis method is based on common accepted models and consistent with various simulation tools, and thus allows for the extraction and comparison of injection- and substrate-independent J 0 -values.