Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

In this study, we investigated the impact of pulse quenching effect on the soft error vulnerabilities in combinational circuits. Simulation results illustrate that soft error vulnerabilities could be reduced by 4-16% for the benchmark circuits when the pulse quenching effect is introduced. By adjusting the cell orientations of the quenching cells in the layout, the soft error vulnerabilities could be further reduced. It is suggested that new placement algorithm considering circuit reliability should be designed to reduce the circuit soft error vulnerabilities.