Comprehensive study on hot carrier reliability of radiation hardened H-gate PD SOI NMOSFET after gamma radiation

Jinghao Zhao,Hang Zhou,Jiangwei Cui,Qiwen Zheng,Ying Wei,Shan-Xue Xi (席善学),Xuefeng Yu,Qi Guo

Comprehensive study on hot carrier reliability of radiation hardened H-gate PD SOI NMOSFET after gamma radiation

2019

Jinghao Zhao
Hang Zhou
Jiangwei Cui
Qiwen Zheng
Ying Wei
Shan-Xue Xi (席善学)
Xuefeng Yu
Qi Guo

ABSTRACTThe authors perform gamma ray irradiation and hot carrier stress on RH H-Gate PD (partially depleted) SOI NMOSFETs as the experimental group and commercial strip-shaped gate PD SOI NMOSFETs...

Keywords:

Atomic physics
Optoelectronics
Radiation
Chemistry
Silicon on insulator
hot carrier stress
hot carrier reliability
NMOS logic
gamma ray irradiation

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