Sensitive measurement of optical nonlinearities of ZnSe based on a phase object

A nonlinear image technique for characterization of the optical nonlinearities is used to investigate the solid semiconductor ZnSe at 600 nm. The method based on a 4f nonlinear image technique with a phase object is used to obtain the diffraction pattern of the nonlinear filter in solid ZnSe located at the Fourier plane by a CCD camera. The nonlinear absorption coefficient and nonlinear refraction index were both obtained by fitting the nonlinear image. Good agreement between the experiment data and the simulated result are obtained indicating a sensitive and powerful method for nonlinear optical measurements.