The realization of a low‐energy ion‐scattering technique with an ion cyclotron resonance spectrometer

A low energy ion scattering technique for investigation of the first monolayer of a surface has been realized in an ion cyclotron resonance mass spectrometer. The secondary-ion mass spectrometry mode is also available in the same configuration. Preliminary results are shown for the analysis of the metal surface of a magneto-optical recording film.