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A New Method for Defect Prediction of Polycrystalline Silicon TFTs with Realistic Grain Boundary Model
A New Method for Defect Prediction of Polycrystalline Silicon TFTs with Realistic Grain Boundary Model
2020
Kyu Jin Kim
Junsoo Lee
Y.G. Yoon
Sunkwon Kim
H. U. Cho
Y. M. Cho
Yong-Goo Kim
Byoungdeog Choi
Keywords:
Computer science
Electronic engineering
Grain boundary
Engineering physics
Polycrystalline silicon
Correction
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