Infrared hemispherical reflectance of carbon nanotube mats and arrays in the 5–50 μm wavelength region

Abstract We present the absolute infrared (5–50 μm) hemispherical reflectance of films produced from commercially available carbon nanotubes. Spectra were obtained with the NPL directional-hemispherical reflectance measurement facility. One group of samples consisted of mats of carbon nanotubes sprayed on copper or silicon substrates. Another group consisted of vertically aligned carbon nanotubes grown on silicon. Two of the materials studied exhibited the lowest hemispherical reflectance so far observed in the infrared wavelength region.