Tracer ion mobility spectrometer measures the movement of ion distribution

The present invention discloses an ion mobility distribution of the tracer ion motion approach spectrometer, comprising the steps of: first select emission characteristics of the sample as a tracer sample, followed by that the tracer sample ionization source ionizing, and ion migration into the spectrometer drift tube, the tracer ion collection plates developed in the test sample ions at the cross section, and finally the measured tracer particle to ions collected on the developing plates with suitable means to emit light, a cross section showing measured ion motion profile position. The present invention employs a light emitting manner tracer ion mobility spectrometer charged ion motion in combination, and can be more intuitively grasp the actual position of the migration of charged ions in the ion distribution in the spectrometer.