MICROSTRUCTURE OF ALPHA-SILICON NITRIDE WHISKERS

Alpha-Si3N4 whiskers grown by the vapour-liquid-solid process have been investigated in a transmission electron microscope. The growth directions of the whiskers are determined to be {1 0 ¯1 1}*, {1 0 ¯1 0}* and {0 0 0 1}*. Defects in the three kinds of whisker have been characterized and branched phenomena are explained on the basis of the TEM observations.