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Depth Profiling of Nitrogen Atoms in No-annealed SiO2/4H-SiC Structures
Depth Profiling of Nitrogen Atoms in No-annealed SiO2/4H-SiC Structures
2019
Hosoi Takuji
Moges Kidist
Sometani Mitsuru
Shimura Takayoshi
Harada Shinsuke
Watanabe Heiji
Keywords:
Atom
Nitrogen
Annealing (metallurgy)
Profiling (computer programming)
Materials science
Analytical chemistry
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