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Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices
Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices
2012
Rebecca Saive
Florian Ullrich
Lars Müller
Michael M. Scherer
Dominik Daume
Michael Kröger
Wolfgang Kowalsky
Keywords:
Scanning probe microscopy
Kelvin probe force microscope
Organic semiconductor
Scanning ion-conductance microscopy
Scanning capacitance microscopy
Analytical chemistry
Materials science
scanning kelvin probe microscopy
Optoelectronics
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