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Atomic force microscopy (AFM) aliasing technique for studying microdomain grains in diblock copolymer thin films
Atomic force microscopy (AFM) aliasing technique for studying microdomain grains in diblock copolymer thin films
2002
Dan E. Angelescu
Christopher Harrison
Matthew L. Trawick
John M. Sebastian
Paul Chaikin
Richard A. Register
Douglas H. Adamson
Keywords:
Materials science
Atomic force microscopy
Thin film
Aliasing
Lipid microdomain
Composite material
Copolymer
Correction
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