Thedegradation ofreading performance inSONOSFlash Memorywith small threshold voltage window

Inthis paper, thethreshold current waspresented asa referential current ofthebit-line tocharacterize the degradation ofreading performances inSONOSflash memory withsmall threshold voltage window. Thethreshold current did notneedanyadditional measurements, itsfeasibility was validated bybothexperiments andcalculations, anditwasmore sensitive tothedegradation ofreading performances thanthe threshold voltage. Andthedegradation ofreading performances wasrelated tothegenerated interface traps. IndexTerms- Flashmemory,SONOS,reading current, threshold voltage, threshold current.