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Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption
Depth Profiling of Carrier Lifetime in Thick 4H-SiC Epilayers Using Two-Photon Absorption
2018
Nadeemullah A. Mahadik
Robert E. Stahlbush
P. B. Klein
Ani Khachatrian
Stephen P. Buchner
Keywords:
Two-photon absorption
Composite material
Carrier lifetime
Analytical chemistry
Materials science
Profiling (computer programming)
Optoelectronics
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