Optical characterization of MOVPE grown GaInP layers

Abstract Ordered and disordered GaInP layers have been grown by MOVPE. The complex refractive index below and above the band edge has been determined by applying conventional absorption spectroscopy, transmission experiments and ellipsometry. We have observed that ordered and disordered samples only differ near the fundamental band gap with respect to these properties, whereas at higher energies, no differences could be detected.