Local laser irradiation technique for SEE testing of ICs

A. I. Chumakov,Alexander A. Pechenkin,D. V. Savchenkov,Alexander S. Tararaksin,Alexey L. Vasil'ev,Andrey V. Yanenko

Local laser irradiation technique for SEE testing of ICs

2011

A. I. Chumakov
Alexander A. Pechenkin
D. V. Savchenkov
Alexander S. Tararaksin
Alexey L. Vasil'ev
Andrey V. Yanenko

The results of local laser simulation for estimation of SEE parameters are presented. Simulation method is based on the local laser irradiation of VLSI by measuring response in power supply circuits and determining laser threshold energy of SEE.

Keywords:

Optoelectronics
Electronic circuit
Physics
Irradiation
Radiation effect
Laser
Very-large-scale integration
Semiconductor laser theory
Threshold energy
Electronic engineering
laser threshold

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