Optical properties of inorganic AgSb recording thin film

50nm Ag1−xSbx (x=10.8–25.5) thin films were prepared by magnetron sputtering. Thermal analysis shows that the phase change occurs around 250°C. The optical property analysis show that the as-deposited Ag80.9Sb19.1 films have high reflectivity of about 62%–73%. After heat treatment at 300°C, the contrast of Ag80.9Sb19.1 film is 12.5%–17% for wavelengths between 400 and 800nm. Dynamic test shows that using the Ag80.9Sb19.1 film as the memory layer of write once optical disk, a carrier-to-noise ratio of about 45dB can be achieved at λ=657nm, numerical aperture of 0.65, and a linear velocity of 3.5m∕s.