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Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy
Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy
2018
Yen Huang
Tzu-Hung Chuang
Chun-I Lu
Chih-Heng Huang
Deng-Sung Lin
Chien-Chen Kuo
Der-Hsin Wei
Keywords:
Analytical chemistry
Cathode
Materials science
Microscopy
Optics
depth dependence
cathode lens
Correction
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