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Importance of Leakage Current Noise Analysis for Accurate Lifetime Prediction of High-k Gate Dielectrics
Importance of Leakage Current Noise Analysis for Accurate Lifetime Prediction of High-k Gate Dielectrics
2005
Kenji Okada
Hiroyuki Ota
Tsuyoshi Horikawa
Yasuyuki Tamura
Takaoki Sasaki
Tomonori Aoyama
Fumio Ootsuka
Akira Toriumi
Keywords:
High-κ dielectric
Dielectric
Leakage (electronics)
Electronic engineering
Materials science
Optoelectronics
Correction
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