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SOI無接合FinFETのRF安定性性能とプロセス変動の影響【Powered by NICT】
SOI無接合FinFETのRF安定性性能とプロセス変動の影響【Powered by NICT】
2017
V Jegadheesan
K. Sivasankaran
Keywords:
Electronic engineering
Aerospace engineering
Engineering
Engineering physics
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