Effect of Rare Earth Elements at Amorphous ReAlO3/SrTiO3 (Re = La, Pr, Nd, Sm, Gd, and Tm) Heterointerfaces.

Although the amorphous two-dimensional electron gas (a-2DEG) of oxides provides new opportunities to explore nanoelectronic as well as quantum devices, the intrinsic effect of rare earth (Re = La, Pr, Nd, Sm, Gd, and Tm) elements at ReAlO3/SrTiO3 heterointerfaces is still largely unknown and needs to be addressed systematically. Herein, we first propose that the ionization potential of Re elements is a critical factor for the 2DEG fabricated by chemical spin coating. Furthermore, the photoresponsive properties of heterointerfaces are investigated comprehensively with the ionization potential ranging from 35.79 to 41.69 eV. The results show that the sheet resistances significantly increase with increasing the ionization potential, and a resistance upturn phenomenon is observed at TmAlO3/SrTiO3 heterointerfaces, which can be attributed to the weak localization effect theoretically. The most important observation is the dramatic transition from negative (-178.3%, Re = La) to positive (+89.9%, Re = Gd) photoresponse at ReAlO3/SrTiO3 heterointerfaces under the irradiation of 405 nm light at 50 K. More remarkably, a unique recovery behavior of transient-persistent photoconductivity coexistence at low temperatures is discovered at the TmAlO3/SrTiO3 heterointerface. This work reveals an effective approach to tune the transport and photoresponsive properties by changing Re elements and paves the way for the application of all-oxide devices.